NDLI: Leakage reduction, variation compensation using partition-based tunable body-biasing techniques

Content Provider	IEEE Xplore Digital Library
Author	Po-Yuan Chen Chiao-Chen Fang TingTing Hwang Hsi-Pin Ma
Copyright Year	2009
Description	Author affiliation: Dept. of Computer Science, National Tsing Hua University, HsinChu, Taiwan 300 (Po-Yuan Chen; Chiao-Chen Fang; TingTing Hwang) \|\| Dept. of Electrical Engineering, National Tsing Hua University, HsinChu, Taiwan 300 (Hsi-Pin Ma)
Abstract	As fabrication technology progresses, several new challenges follow. Among them, the most noticeable two are process variations and leakage current of the circuit. To tackle these two problems, an effective way is to use body biasing technique. In substance, using RBB technique can minimize leakage current but increase the delay of a gate. FBB technique decreases the delay but increases leakage current. In previous works, a single body biasing is applied to whole circuit. In a slow circuit, since the FBB is applied to whole circuit, the leakage current increases dramatically. In a fast circuit, RBB is applied to decrease the leakage current. However, without violating the timing specification, the value of body biasing is restricted by the critical paths, and the saving of leakage current is limited. In this paper, we propose a design flow to partition the circuit into subcircuits so that each subcircuit can be applied its individual RBB or FBB to reduce the leakage current and cope with process variations. In the experimental result, our method is able to save leakage current from 41% to 46% as compared with design without body biasing technique. Under process variations, our method can save 40% to 49% leakage on fast circuits and 15% to 32% on slow circuits.
Starting Page	170
Ending Page	173
File Size	253468
Page Count	4
File Format	PDF
ISBN	9781424427819
DOI	10.1109/VDAT.2009.5158122
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-04-28
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Leakage current Delay Timing Fabrication Computer science CMOS technology Voltage Circuit simulation Tunable circuits and devices Power dissipation
Content Type	Text
Resource Type	Article

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