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Content Provider | IEEE Xplore Digital Library |
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Author | Ralston, P. Oliver, M. Vummidi, K. Raman, S. |
Copyright Year | 2011 |
Abstract | Prior work has demonstrated a new process utilizing room temperature liquid metal, galinstan, as an interconnect material for flip chip bonding. This interconnect forms a flexible bond between chips and carriers and therefore a flip chip assembly using this technology is much less susceptible to thermomechanical stresses. This paper applies this concept to interconnect MMIC chips to 3D Polystrata transmission line structures. A prefabricated GaAs MMIC chip is post processed for liquid metal assembly. Measured results show, over the MMIC's 4.9 - 8.5 GHz frequency range, the system's overall reduction in gain of the MMIC is 1.4 dB or 0.7dB per RF transition as compared to direct probing of the MMIC chip. |
Starting Page | 1 |
Ending Page | 4 |
File Size | 1356639 |
Page Count | 4 |
File Format | |
ISBN | 9781612847115 |
ISSN | 15508781 |
e-ISBN | 9781612847122 |
e-ISBN | 9781612847108 |
DOI | 10.1109/CSICS.2011.6062489 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2011-10-16 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | MMICs Assembly Metals Flip chip Transmission line measurements Gallium arsenide Integrated circuit interconnections |
Content Type | Text |
Resource Type | Article |
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