NDLI: A discussion on SRAM forward/inverse problem analyses for RTN long-tail distributions

Content Provider	IEEE Xplore Digital Library
Author	Somha, W. Yamauchi, H. Ma YuYu
Copyright Year	2013
Description	Author affiliation: Inf. Intell. Syst.3-30-1, Fukuoka Inst. of Technol., Fukuoka, Japan (Somha, W.; Yamauchi, H.; Ma YuYu)
Abstract	This paper discusses, for the first time, how the statistical SRAM design analyses should be changed when: (1) the shift-amount of the time-dependent (TD) voltage margin variations (MV) after the screening test will become larger than that before and (2) the shapes of the MV distribution will change from the Gaussian to the complex mixtures of Gamma distributions. We discuss on the SRAM TD-MV analyses with not only the forward problem but also the inverse problem, i.e., deconvolution analyses. The proposed algorithm for the deconvolution to circumvent the issues caused by high-pass filtering behavior is discussed. Based on the proposed convolution /deconvolution design analyses, it has been shown for the first time that: (1) detecting the truncating point of the distributions of TD-MV by the screening test and (2) predicting the required the MV-shift-amount by the assisted circuit schemes to avoid the out of specs in the market during the life-time, etc, has become enabled based on the target specification.
Starting Page	58
Ending Page	63
File Size	3028425
Page Count	6
File Format	PDF
ISBN	9781479913312
ISSN	21593469
DOI	10.1109/ISVLSI.2013.6654623
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-08-05
Publisher Place	Brazil
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Deconvolution Convolution Resource description framework Random access memory Filtering Equations Long-tail distribution SRAM Gamma Mixtures Random telegraph noise
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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A discussion on SRAM forward/inverse problem analyses for RTN long-tail distributions

Deconvolution algorithm dependencies of estimation errors of RTN effects on subnano-scaled SRAM margin variation

A RTN variation tolerant guard band design for a deeper nanometer scaled SRAM screening test: Based on EM Gaussians mixtures approximations model of long-tail distributions

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Blind deconvolution technique for extracting unknown two factors of RTN and truncated RDF from given target for overall SRAM margin variations

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