NDLI: Moisture Determination in IC Packages by Conductance Technique

Content Provider	IEEE Xplore Digital Library
Author	Annamalai, N. K. Islam, S.M.R.
Copyright Year	1986
Description	Author affiliation: Clarkson University, Potsdam, NY 13676 (Islam, S.M.R.) \|\| Rome Air Development Center, Solid State Sciences Division, Hanscom AFB, MA 01731 (Annamalai, N. K.)
Abstract	An a.c. conductance technique using a lock-in-amplifier (LIA) is described. The conductance technique is a non-destructive technique and uses the die as a sensor. Our experiments and theoretical calculations revealed that the moisture-induced conductance variation is 10 to 400% whereas the moisture-induced capacitance variation is 0 to 20%. Hence, even though capacitance and conductance values were measured, only conductance variations are reported. A circuit model has been developed to explain the observed experimental behavior. This technique is thus superior to capacitance technique in deterining the low levels of moisture (<5000ppmu) in IC packages. The selective condensation problem experienced in the Harris or Al2O3 sensors is non existent in the conductance technique. Since the applied voltage in the conductance method is ~l00mV, there is no dissociation of water into hydrogen and oxygen, as is possible in the case of Harris sensors. Further, the moisture content determined by this non-destructive technique correlates well with the residual gas analysis (RGA) by the mass spectrometer. This technique is non-destructive, reliable, rapid and suitable for in-line testing.
Starting Page	61
Ending Page	68
File Size	7877153
Page Count	8
File Format	PDF
ISSN	07350791
DOI	10.1109/IRPS.1986.362113
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1986-04-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Moisture Integrated circuit packaging Voltage Semiconductor device measurement Diodes Capacitance measurement Calibration Frequency Temperature sensors Pins
Content Type	Text
Resource Type	Article

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