NDLI: Optimizing test confidence based on life cycle cost

Content Provider	IEEE Xplore Digital Library
Author	Bindel, S.R.
Copyright Year	2013
Description	Author affiliation: U.S. Army Test & Evaluation Command, Aberdeen Proving Ground, MD, USA (Bindel, S.R.)
Abstract	Current Army acquisition policy states that systems shall demonstrate reliability requirements with high confidence, but the policy fails to state what `high' confidence means. Despite this, for every system there is an optimal confidence level with which to demonstrate the reliability requirement. The optimal confidence level may be driven by many competing factors including cost, schedule, Soldier safety, and mission criticality. Most of these factors are difficult to quantify, and leave the community to make a judgment call on the appropriate confidence level. In the absence of other driving or quantifiable metrics, one way to choose an optimal confidence level is to balance test cost against the risk to life cycle cost. This method deals in a natural metric: money. It is easily understood by the layman, and is straightforward to compare to most other programmatic risks. Conveniently it provides objective support for the common sense solution that inexpensive systems (to buy and test) that will be purchased in large quantities should be tested at higher confidence, while expensive systems (to buy and test) bought in low quantities possibly should be tested at lower confidence. If the other factors are not overwhelming, or do not suggest a particular confidence level, confidence can be optimized by balancing test cost against life cycle cost.
Sponsorship	IEEE Reliability Soc.
Starting Page	1
Ending Page	5
File Size	920793
Page Count	5
File Format	PDF
ISBN	9781467347099
ISSN	0149144X
e-ISBN	9781467347112
DOI	10.1109/RAMS.2013.6517768
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Reliability Measurement Testing Maintenance engineering Communities Mathematical model Safety RAM Life cycle cost LCC O&S cost test confidence reliability requirements development
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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