Please wait, while we are loading the content...
Please wait, while we are loading the content...
| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kaminski, R.T. |
| Copyright Year | 2013 |
| Description | Author affiliation: MITRE Corp., Bedford, MA, USA (Kaminski, R.T.) |
| Abstract | Planning for reliability growth requires a disciplined approach rather than an “ad hoc” approach. The reliability growth program must be devised early so that adequate test phase lengths and test assets can be planned to optimize reliability growth opportunities. The primary goal of the Reliability Growth Test (RGT) is to improve the probability of demonstrating achievement of the reliability requirement during Operational Testing (OT); which should also translate to effective reliability performance when fielded. The first step in the planning process is to determine the length of test time needed to reach a planned reliability growth goal before entry into OT testing. The planned growth goal should be above the reliability requirement to ensure that the requirement can be demonstrated with at least an 80 percent statistical lower confidence bound (LCB) during the OT phase. The primary inputs to planning models in general are: the initial reliability value from which the growth will commence, the anticipated reliability “growth rate”, the target or goal reliability, and the planned test length (phases). The initial starting reliability value is a critical input variable as it tends to influence overall test length. The best method for selecting an initial reliability value is to have some early test results where reliability has been determined by actual observed performance. The alternate method of selecting the initial reliability value based on some percentage of the requirement would entail formulating a less effective and higher risk test strategy. The next value that is critical to planning models is the growth rate. Choosing growth parameters that are realistic is an important step so that adequate test times can be planned. The final two major contributors are the goal reliability and test length, which directly influence cost and schedule. For this reason, various reliability growth strategies should be explored in order to optimize the reliability growth; balancing technical risk with program schedule and budget. Formulating effective reliability growth strategies also requires that a vigorous root cause analysis and corrective action (RCA/CA) process be developed. Simply replacing failed components during the RGT; without removing the underlying failure mode, will not result in reliability growth. Understanding the root cause of surfaced failure modes and devising effective mitigation strategies is the only method that will achieve reliability growth. This is why total calendar time that includes actual test time and time to perform RCA/CA must be considered and planned into the RGT and program test schedule. Another aspect to consider in planning the RGT is to identify items that are not likely to undergo reliability growth. The use of Commercial-Off-The-Shelf (COTS) items in many DoD programs is a reality that cannot be ignored. These COTS items will have no effective growth avenues since COTS suppliers are unlikely to change product designs. The RGT can be used to assess COTS ability to meet allocated reliability requirements and compliance with product specifications and warranties. The RGT can also provide an opportunity to assess the success of the COTS design integration process and robustness in the actual use environment. |
| Sponsorship | IEEE Reliability Soc. |
| Starting Page | 1 |
| Ending Page | 5 |
| File Size | 409228 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781467347099 |
| ISSN | 0149144X |
| e-ISBN | 9781467347112 |
| DOI | 10.1109/RAMS.2013.6517675 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-01-28 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Planning Input variables Reliability engineering Mathematical model Computational modeling SPLAN Duane PM2 Reliability Growth |
| Content Type | Text |
| Resource Type | Article |
National Digital Library of India (NDLI) is a virtual repository of learning resources which is not just a repository with search/browse facilities but provides a host of services for the learner community. It is sponsored and mentored by Ministry of Education, Government of India, through its National Mission on Education through Information and Communication Technology (NMEICT). Filtered and federated searching is employed to facilitate focused searching so that learners can find the right resource with least effort and in minimum time. NDLI provides user group-specific services such as Examination Preparatory for School and College students and job aspirants. Services for Researchers and general learners are also provided. NDLI is designed to hold content of any language and provides interface support for 10 most widely used Indian languages. It is built to provide support for all academic levels including researchers and life-long learners, all disciplines, all popular forms of access devices and differently-abled learners. It is designed to enable people to learn and prepare from best practices from all over the world and to facilitate researchers to perform inter-linked exploration from multiple sources. It is developed, operated and maintained from Indian Institute of Technology Kharagpur.
Learn more about this project from here.
NDLI is a conglomeration of freely available or institutionally contributed or donated or publisher managed contents. Almost all these contents are hosted and accessed from respective sources. The responsibility for authenticity, relevance, completeness, accuracy, reliability and suitability of these contents rests with the respective organization and NDLI has no responsibility or liability for these. Every effort is made to keep the NDLI portal up and running smoothly unless there are some unavoidable technical issues.
Ministry of Education, through its National Mission on Education through Information and Communication Technology (NMEICT), has sponsored and funded the National Digital Library of India (NDLI) project.
| Sl. | Authority | Responsibilities | Communication Details |
|---|---|---|---|
| 1 | Ministry of Education (GoI), Department of Higher Education |
Sanctioning Authority | https://www.education.gov.in/ict-initiatives |
| 2 | Indian Institute of Technology Kharagpur | Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project | https://www.iitkgp.ac.in |
| 3 | National Digital Library of India Office, Indian Institute of Technology Kharagpur | The administrative and infrastructural headquarters of the project | Dr. B. Sutradhar bsutra@ndl.gov.in |
| 4 | Project PI / Joint PI | Principal Investigator and Joint Principal Investigators of the project |
Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon |
| 5 | Website/Portal (Helpdesk) | Queries regarding NDLI and its services | support@ndl.gov.in |
| 6 | Contents and Copyright Issues | Queries related to content curation and copyright issues | content@ndl.gov.in |
| 7 | National Digital Library of India Club (NDLI Club) | Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach | clubsupport@ndl.gov.in |
| 8 | Digital Preservation Centre (DPC) | Assistance with digitizing and archiving copyright-free printed books | dpc@ndl.gov.in |
| 9 | IDR Setup or Support | Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops | idr@ndl.gov.in |
|
Loading...
|