NDLI: Intermittent faults and effects on reliability of integrated circuits

Content Provider	IEEE Xplore Digital Library
Author	Constantinescu, C.
Copyright Year	2008
Description	Author affiliation: Adv. Micro Devices, Fort Collins, CO (Constantinescu, C.)
Abstract	A significant amount of research has been aimed at analyzing the effects of high energy particles on semiconductor devices. However, less attention has been given to the intermittent faults. Field collected data and failure analysis results presented in this paper clearly show intermittent faults are a major source of errors in modern integrated circuits. The root cause for these faults ranges from manufacturing residuals to oxide breakdown. Burstiness and high error rates are specific manifestations of the intermittent faults. They may be activated and deactivated by voltage, frequency, and operating temperature variations. The aggressive scaling of semiconductor devices and the higher circuit complexity are expected to increase the likelihood of occurrence of the intermittent faults, despite the extensive use of fault avoidance techniques. Herein we discuss the effectiveness of several fault tolerant approaches, taking into consideration the specifics of the errors generated by intermittent faults. Several solutions, previously proposed for handling particle induced soft errors, are exclusively based on software and too slow for handling large bursts of errors. As a result, hardware implemented fault tolerant techniques, such as error detecting and correcting codes, self checking, and hardware implemented instruction retry, are necessary for mitigating the impact of the intermittent faults, both in the case of microprocessors, and other complex integrated circuits.
Starting Page	370
Ending Page	374
File Size	464240
Page Count	5
File Format	PDF
ISBN	9781424414604
ISSN	0149144X
DOI	10.1109/RAMS.2008.4925824
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-01-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Integrated circuit reliability Semiconductor devices Fault tolerance Hardware Failure analysis Semiconductor device manufacture Electric breakdown Error analysis Voltage timing violations intermittent faults oxide breakdown process variations
Content Type	Text
Resource Type	Article

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