NDLI: A methodology for managing reliability growth during operational mission profile testing

Content Provider	IEEE Xplore Digital Library
Author	Crow, L.H.
Copyright Year	2008
Description	Author affiliation: Crow Reliability Resources, Madison, AL (Crow, L.H.)
Abstract	It is common practice for systems to be subjective to operational testing during their development program. The objective of this testing is to evaluate the performance, including reliability, of the system under conditions that represent actual use conditions. Because of expense, resources, schedule, and other considerations, these operational tests rarely represent exactly the actual use conditions. Rather, stated mission profile conditions are specific for the operational testing. These mission profiles conditions are typically general statements that guide the testing on an average basis during the testing. Because of practical constraints the elements that make up the mission profile conditions are typically tested under varying schedules with the intent that on average the mission profile conditions are met. It is also common practice that reliability corrective actions are incorporated into the system during this type of testing. That is, the test is often an operational mission profile reliability growth test. Under these conditions, we usually have a lack of structure for managing the elements that make up the mission profiles, which makes it very difficult to have an agreed-on methodology for estimating the system's reliability. This is especially true if reliability growth is occurring. Many systems fail operational testing because key assessments parameters can not be made in a straightforward clear manner so that management can take timely and appropriate action. This paper addresses this issue and presents a methodology currently being applied on major Department of Defense programs for operational reliability growth testing.
Starting Page	48
Ending Page	53
File Size	375870
Page Count	6
File Format	PDF
ISBN	9781424414604
ISSN	0149144X
DOI	10.1109/RAMS.2008.4925768
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-01-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Reliability Guidelines Data analysis Resource management Risk management Printers Mission Profiles Operational Testing Reliability Management Reliability Growth
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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