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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Feng-Bin Sun Kececloglu, D.B. |
| Copyright Year | 1999 |
| Description | Author affiliation: Component & Production Reliability Eng., Quantum Corp., Milpitas, CA, USA (Feng-Bin Sun) |
| Abstract | For a censored sample where withdrawns or suspensions are present, Kaplan-Meier-estimation (KME) method, also called product-limit-estimation (PLE) method, and piecewise-exponential-estimation (PEXE) method, have been typically used to estimate both the survivor function (or cdf) and the total time on test (TTT) statistic at each observed failure time. This paper presents a new method, called mean-order-number (MON) method, for estimating TTT statistics and TTT plot for a censored sample. This method is illustrated using Dodson's example as quoted by numerous authors. A comparison is made among MON, KME, and PEXE. It turns out that MON method is not only easy to use but its results are consistent with KME and PEXE as well. |
| Starting Page | 112 |
| Ending Page | 117 |
| File Size | 661746 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780351436 |
| DOI | 10.1109/RAMS.1999.744105 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-01-18 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Statistics Life testing Distribution functions Joining processes H infinity control Suspensions Maintenance |
| Content Type | Text |
| Resource Type | Article |
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