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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Eliezer, O. Bashir, I. Staszewski, R.B. Balsara, P.T. |
| Copyright Year | 2007 |
| Description | Author affiliation: Texas Instrum., Dallas (Eliezer, O.; Bashir, I.; Staszewski, R.B.) |
| Abstract | We present a novel approach for built-in self-testing (BIST) of an RF wireless transmitter. This approach, based on fully-digital hardware and on software algorithms, allows the testing of the transmitter's analog/RF circuitry while providing low-cost replacements for the costly traditional RF tests. The testing approach is structural in nature and substitutes for the commonly employed RF performance testing of high-cost test equipment and extended test times. The test coverage achieved for the analog circuitry is maximized to approach 100% and the test-time and associated test costs are minimized. The presented techniques have been successfully verified in a commercial 90 nm CMOS single-chip GSM radio based on the Digital RF Processor (DRPtrade) technology. |
| Starting Page | 339 |
| Ending Page | 342 |
| File Size | 234793 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424405300 |
| ISSN | 15292517 |
| DOI | 10.1109/RFIC.2007.380896 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-06-03 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Automatic testing GSM Circuit testing Radio frequency Radio transmitters Built-in self-test Software testing Hardware Software algorithms Test equipment |
| Content Type | Text |
| Resource Type | Article |
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