NDLI: Status of self-magnetic pinch diode investigations on RITS-6

Content Provider	IEEE Xplore Digital Library
Author	Hahn, K. Bruner, N. Cordova, S.R. Crotch, I. Johnston, M.D. Leckbee, J.J. Molina, I. Oliver, B.V. Portillo, S. Threadgold, J. Webb, T.J. Welch, D.R. Ziska, D.
Copyright Year	2009
Description	Author affiliation: Sandia National Laboratories, Albuquerque, NM 87185-1195, USA (Hahn, K.; Cordova, S.R.; Johnston, M.D.; Leckbee, J.J.; Molina, I.; Oliver, B.V.; Webb, T.J.) \|\| Atomic Weapons Establishment Reading, Berkshire, RG74PR , UK (Crotch, I.; Threadgold, J.) \|\| KTech Corp. Albuquerque, NM 87123, USA (Portillo, S.; Ziska, D.) \|\| Voss Scientific LLC Albuquerque, NM 87108, USA (Bruner, N.; Welch, D.R.)
Abstract	The electron beam-driven self-magnetic pinch diode is presently fielded on the RITS-6 accelerator at Sandia National Laboratories and is a leading candidate for future flash x-ray radiographic sources. The diode is capable of producing sub 3-mm radiation spot sizes and greater than 350 rads measured at 1 m from the x-ray source. While RITS-6 is capable of delivering up to 11.5 MV using a magnetically insulated transmission line (MITL), the diode typically operates between 6 – 7 MV. Because the radiation dose has a power-law dependence on diode voltage, this limits the dose production on RITS. Coupling this low-impedance (∼ 40–60 ohms) diode to a MITL with similar or higher impedance affects its radiographic potential. The sensitivity in diode operation is compounded by the interaction of evolving plasmas from the cathode and anode, which seem to limit stable diode operation to a narrow regime. To better quantify the diode physics, high-resolution, time-resolved diagnostics have been utilized which include plasma spectroscopy, fast-gated imaging, x-ray p-i-n diodes, x-ray spot size, and diode and accelerator current measurements. Data from these diagnostics are also used to benchmark particle-in-cell simulations in order to better understand the underlying diode physics. An overview of these experiments and simulations is presented.
Starting Page	34
Ending Page	39
File Size	1056972
Page Count	6
File Format	PDF
ISBN	9781424440641
DOI	10.1109/PPC.2009.5386203
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	P-i-n diodes Plasma accelerators Plasma diagnostics Plasma measurements Plasma stability Plasma x-ray sources Physics X-ray imaging Electron beams Electron accelerators
Content Type	Text
Resource Type	Article

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