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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cho, H.G. Han, S.W. Park, K.H. Han, D.H. Lee, D.I. Choi, I.H. Kim, T.Y. |
| Copyright Year | 2003 |
| Description | Author affiliation: Adv. Electr. Mater. Group, KERI, xx, South Korea (Cho, H.G.; Han, S.W.; Park, K.H.; Han, D.H.) |
| Abstract | The suspension insulators are subjected to harsh environments in service for a long time. Long-term reliability of the insulators is required for both mechanical and electrical performances. This study described some basic performance test and accelerated ageing test by cool-heat cycling methods and thermal mechanical performance test methods on alumina porcelain insulators (new and aged) used for transmission line in KOREA. In case of aged porcelain, the failure in basic performance tests happened in cool-heat tests. Based on this characteristic, we studied the method predicting failure phenomena through more severe accelerated cool-heat ageing. Results on leakage current and tangent loss after accelerated cool-heat ageing showed that there was some damage effects by thermal shock in the porcelain insulator with cristoballiet body. It cannot avoid damaging from mechanical and thermal shocks, but insulator body with the matrix reinforced with crystalline phases such as alumina and mullite have advantage over the suppression of radical crack advance. From the accelerating thermal mechanical performance test, it was indicated that sample A was more severely damaged by thermal mechanical stress than other samples. |
| Sponsorship | IEEE Dielectrics & Electrical Insulation Soc. IEE Japan |
| Starting Page | 415 |
| Ending Page | 418 |
| File Size | 273779 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780377257 |
| ISSN | 10817735 |
| DOI | 10.1109/ICPADM.2003.1218439 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Porcelain Transmission lines Accelerated aging Performance evaluation Insulator testing Life estimation Electric shock Thermal stresses Dielectrics and electrical insulation Leakage current |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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