NDLI: A novel sheath fault location method for high voltage power cable

Content Provider	IEEE Xplore Digital Library
Author	Minghua Li Bingyin Xu Zhang Yan
Copyright Year	2003
Description	Author affiliation: Sch. of Electr. Eng., Xi'an Jiaotong Univ., China (Minghua Li)
Abstract	It is important for power cable, especially high voltage single core cable, to have a healthy sheath. Once the cable sheath is faulty, it would accelerate the aging process of cable insulation, and result in failure of the conventional on-line condition monitoring system due to inaccurate insulation measurement. Traditional fault location methods for main insulation of power cable such as the radar method are no longer valid for sheath insulation fault. The bridge method and voltage comparison method are applicable for sheath fault location, but their accuracies are subject to influences of the contact resistance and resistance of test leads. A novel fault location method for power cable sheath fault is presented in this paper. The resistance of outer metal layer of the fault cable between the terminal and the fault position is measured, and then compared to the known unit resistance to calculate distance to fault. Therefore, it is free from the influence of contact resistance and intrinsic resistance of test leads. Case studies show that the proposed method is effective to determine the position of sheath faults of high voltage power cable on-site.
Sponsorship	IEEE Dielectrics & Electrical Insulation Soc. IEE Japan
Starting Page	195
Ending Page	198
File Size	208628
Page Count	4
File Format	PDF
ISBN	0780377257
ISSN	10817735
DOI	10.1109/ICPADM.2003.1218386
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-06-01
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault location Voltage Power cables Cable insulation Contact resistance Cable shielding Electrical resistance measurement Testing Accelerated aging Condition monitoring
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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