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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wang Lei Zeng Shufan Zhang Jiangtao Liu Lijuan Zhou Hao Li Min Lu Zuliang Zhou Shaoyuan |
| Copyright Year | 2010 |
| Description | Author affiliation: Yunnan institute of metrology, China (Zeng Shufan) || National institute of metrology, Bei San Huan Dong Road No.18, Beijing, China (Zhang Jiangtao; Liu Lijuan; Zhou Hao; Li Min; Lu Zuliang) || Harbin Institute of technology, West Da Zhi Street No.92, Heilongjiang, China (Wang Lei) || Zhejiang institute of metrology, China (Zhou Shaoyuan) |
| Abstract | This paper described a new flicker test standard developed in National Institute of Metrology (NIM) for the calibration of voltage fluctuation and flicker. It meets the requirement of both flickermeter and flicker source according to the IEC 61000-4-15. |
| Starting Page | 263 |
| Ending Page | 264 |
| File Size | 187277 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781424467952 |
| e-ISBN | 9781424467976 |
| DOI | 10.1109/CPEM.2010.5545110 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-06-13 |
| Publisher Place | Korea (South) |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Testing Sampling methods Voltage fluctuations Metrology Equations Resistors Measurement standards Standards development IEC standards Coaxial components |
| Content Type | Text |
| Resource Type | Article |
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