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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Afsar, M.N. Korolev, K.A. Zijing Li |
| Copyright Year | 2010 |
| Description | Author affiliation: High Frequency Research, Materials Measurement and Information Center, Department of Electrical and Computer Engineering, Tufts University, Medford, Massachusetts 02155-5528, USA (Afsar, M.N.; Korolev, K.A.; Zijing Li) |
| Abstract | Transmittance measurements on various single crystal ferroelectric materials over a broad millimeter-wave frequency range have been performed. The frequency dependence of the complex dielectric permittivity has been determined in the millimeter wave region for the first time. The measurements have been employed using a free-space quasi-optical millimeter-wave spectrometer equipped with a set of high power backward wave oscillators (BWOs) as sources of coherent radiation, tunable in the range from 30 – 120 GHz. The uncertainties and possible sources of instrumentation and measurement errors related to the free-space millimeter-wave technique are discussed. This work has demonstrated that precise MMW permittivities can be obtained even on small thin crystals using the BWO quasi-optical approach. The real and imaginary parts of dielectric permittivity have been extracted from the accurate transmittance spectra. The effect of crystallographic orientation on complex permittivity, which is shown to be more than a factor of 1.5 between different orientations, has been carefully examined for Lithium Niobate. |
| Starting Page | 583 |
| Ending Page | 584 |
| File Size | 185186 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781424467952 |
| e-ISBN | 9781424467976 |
| DOI | 10.1109/CPEM.2010.5544817 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-06-13 |
| Publisher Place | Korea (South) |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Millimeter wave measurements Dielectric measurements Ferroelectric materials Millimeter wave technology Permittivity measurement Frequency measurement Performance evaluation Frequency dependence Power measurement Spectroscopy |
| Content Type | Text |
| Resource Type | Article |
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