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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Dupree, A.J. Jarrett, D.G. |
| Copyright Year | 2010 |
| Description | Author affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899-8171 USA (Dupree, A.J.; Jarrett, D.G.) |
| Abstract | Discussed are recent efforts undertaken at the National Institute of Standards and Technology (NIST) to create a new set of high-resistance standards (specifically in the 10 MΩ to 100 MΩ range) using newer, more stable film-type resistors. The history of film-type resistors in high-resistance standards is briefly reviewed. Also examined are the improvements made upon similar resistance standard implementations done by the Instituto Nacional de Tecnología Industrial (INTI) in Argentina. The new NIST standards use a guarded, highly resistive backbone to reduce leakage currents. Promising results, including reduced settling time and improved stability, are presented. |
| Starting Page | 613 |
| Ending Page | 614 |
| File Size | 162509 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781424467952 |
| e-ISBN | 9781424467976 |
| DOI | 10.1109/CPEM.2010.5543759 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-06-13 |
| Publisher Place | Korea (South) |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Resistors NIST Measurement standards Video recording Surface resistance Spine Leakage current Stability Hermetic seals Moisture |
| Content Type | Text |
| Resource Type | Article |
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