NDLI: Voltage stability indices comparison on the IEEE-39 bus system using RTDS

Content Provider	IEEE Xplore Digital Library
Author	Cupelli, M. Doig Cardet, C. Monti, A.
Copyright Year	2012
Description	Author affiliation: Institute for Automation of Complex Power Systems, E.ON Energy Research Center, RWTH Aachen University, 52074, Germany (Cupelli, M.; Doig Cardet, C.; Monti, A.)
Abstract	This paper discusses the performance of two different line voltage stability indices previously studied in literature the Line stability Index (Lmn) and Voltage Collapse Point Indicators (VCPI). The objective is to identify which index is most suitable for being used in control applications. The results presented here will provide a first indication. The indices were tested in the IEEE 39-bus system. The RTDS simulator was used to create data sets and the indices where computed using the control block components for real time operation. This method was chosen to have the values of the indices available for future development of control algorithms based on stability indices.
Starting Page	1
Ending Page	6
File Size	2254807
Page Count	6
File Format	PDF
ISBN	9781467328685
e-ISBN	9781467328685
DOI	10.1109/PowerCon.2012.6401284
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-10-30
Publisher Place	New Zealand
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Indexes real-time simulation voltage stability indices power system
Content Type	Text
Resource Type	Article

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Voltage stability indices comparison on the IEEE-39 bus system using RTDS