NDLI: Progress in enhanced triggering and increasing of hold-off voltage capability with pseudospark plasma switches

Content Provider	IEEE Xplore Digital Library
Author	Frank, K. Bickes, C. Ernst, U. Iberler, M. Meier, J. Prucker, U. Schlaug, M. Schwab, J. Urban, J. Weisser, W.
Copyright Year	1998
Description	Author affiliation: Phys. Inst., Erlangen-Nurnberg Univ., Germany (Frank, K.)
Abstract	This paper reports on two novel trigger techniques for pseudosparks switches. One is a trigger unit, based upon a modified surface flashover; the other one works by electron emission from high-dielectric materials such as PLZT perovskite ceramics or related materials of similar high dielectric constant. With this trigger scheme pseudospark plasma switches have been operated at pulse repetition rates (PRR) up to 20 Hz and more. A PRR of 1 kHz in burst mode is possible. The cumulative number of trigger discharges is above 10/sup 7/ without any significant performance degradation. The surface flashover unit consists of a cylindrical ceramic rod with two contact electrodes. Depending on trigger voltage polarity one electrode turns positive to the grounded hollow cavity. In other words, the cavity starts playing a part of a hollow-anode with respect to this electrode. As a consequence a manifold of mini-arc discharges directed towards the hollow-anode appear inside the cavity. The hollow-anode plasma itself serves now as an electron source for the main gap. The main advantage of both triggering schemes lie in their simultaneous simplicity and reliability allowing high repetition rates, long lifetime, and the complete absence of keep-alive electrodes and stand-by power consumption. In order to improve hold-off voltage capability two-stage pseudospark switches with an intermediate electrode are under test. The apertures of this electrode are not aligned with the boreholes of the main electrodes. By this slight modification the hold-off voltage reliability could be extended beyond 35 kV compared to 22 kV for a one-stage device.
Starting Page	177
Ending Page	180
File Size	499661
Page Count	4
File Format	PDF
ISBN	0780342445
ISSN	10768467
DOI	10.1109/MODSYM.1998.741221
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-06-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Voltage Electrodes Switches Flashover Dielectric materials Ceramics Electron emission High-K gate dielectrics Plasma materials processing Degradation
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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