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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Fukunaga, K. Hosako, I. Picollo, M. |
| Copyright Year | 2010 |
| Description | Author affiliation: Istitute di Fisica Applicata, "Nello Carrara", Consiglio Nazionale delle Ricerche, 50019 Sesto Fiorentino, Italy (Picollo, M.) || National Institute of, Information and Communications Technology, Koganei, Tokyo, Japan (Fukunaga, K.; Hosako, I.) |
| Abstract | Terahertz (THz) waves can penetrate opaque materials and fingerprint spectra appear as those in infrared bands. The technique is expected to be used as a new non-invasive analysis method for various materials. Time domain reflection imaging, in particular, uses THz pulses that propagate in specimens, and in this technique, pulses reflected from the internal boundaries of the specimen indicate the internal structure. We have developed a spectral database of painting materials, and applied THz time domain imaging for analysis of artworks. Experimental results, including first ever non-invasive cross section image of a tempera masterpiece, proved that THz wave can observe layer structure of the artwork from the wood support, gesso preparation layers, and the painting layer. This technique should also be useful to detect internal defect of various types of opaque dielectric materials such as multi layer insulations. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 945226 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424479450 |
| e-ISBN | 9781424479443 |
| e-ISBN | 9781424479436 |
| DOI | 10.1109/ICSD.2010.5567932 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-07-04 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Imaging Materials Painting Spectroscopy Reflection Pigments Time domain analysis cultural heritage terahertz |
| Content Type | Text |
| Resource Type | Article |
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