NDLI: An exploration of physical ageing in electrically-stressed polymeric insulating films using the quartz crystal shear wave sensor technique

Content Provider	IEEE Xplore Digital Library
Author	Connor, P. Jones, J.P. Llewellyn, J.P. Lewis, T.J.
Copyright Year	2001
Description	Author affiliation: Inst. of Molecular & Biomolecular Electron., Univ. of Wales, Bangor, UK (Connor, P.)
Abstract	The mechanical stress induced by a strong electrical field could be a significant contributing factor to the electrical ageing and breakdown of insulating polymeric materials such as polyethylene. An extensive literature exists describing the nature of the failure of polyethylene under mechanical stress. The initial failure is considered to be the generation of sub-microscopic voids, which coalesce to form a crack, and is accompanied by chain scission and electromagnetic radiation. These features bear remarkable resemblance to those, such as trees, appearing in electrical breakdown. If electrically induced mechanical stress is indeed a significant factor in electrical breakdown, then it might be expected that marked changes in the viscoelastic parameters of the polymer, indicative of morphological change, might accompany electrical stressing. Moreover such changes might appear at stresses well below those for breakdown. To test this there are a number of ways in which conventional mechanical testing at low frequency might be adapted to allow simultaneous electrical stressing. We have adopted an unconventional approach, employing a quartz crystal shear wave sensor to determine the shear wave moduli of polyethylene under electrical stress. The technique has been refined. We are now able to demonstrate that the changes in the mechanical viscoelastic moduli of polyethylene in response to electrical stress are quite complex and polarity dependent.
Sponsorship	IEEE Dielectr. & Electr. Insulation Soc
Starting Page	39
Ending Page	42
File Size	365296
Page Count	4
File Format	PDF
ISBN	0780363523
DOI	10.1109/ICSD.2001.955506
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-06-25
Publisher Place	Netherlands
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aging Stress Electric breakdown Polyethylene Polymers Viscosity Elasticity Testing Dielectrics and electrical insulation Plastic insulation
Content Type	Text
Resource Type	Article

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