NDLI: On-demand test suite reduction

Content Provider	IEEE Xplore Digital Library
Author	Dan Hao Lu Zhang Xingxia Wu Hong Mei Rothermel, G.
Copyright Year	2012
Description	Author affiliation: Department of Computer Science and Engineering, University of Nebraska, Lincoln, 68588, USA (Rothermel, G.) \|\| Key Laboratory of High Confidence Software Technologies, Ministry of Education, Beijing, China (Dan Hao; Lu Zhang; Xingxia Wu; Hong Mei)
Abstract	Most test suite reduction techniques aim to select, from a given test suite, a minimal representative subset of test cases that retains the same code coverage as the suite. Empirical studies have shown, however, that test suites reduced in this manner may lose fault detection capability. Techniques have been proposed to retain certain redundant test cases in the reduced test suite so as to reduce the loss in fault-detection capability, but these still do concede some degree of loss. Thus, these techniques may be applicable only in cases where loose demands are placed on the upper limit of loss in fault-detection capability. In this work we present an on-demand test suite reduction approach, which attempts to select a representative subset satisfying the same test requirements as an initial test suite conceding at most l% loss in fault-detection capability for at least c% of the instances in which it is applied. Our technique collects statistics about loss in fault-detection capability at the level of individual statements and models the problem of test suite reduction as an integer linear programming problem. We have evaluated our approach in the contexts of three scenarios in which it might be used. Our results show that most test suites reduced by our approach satisfy given fault detection capability demands, and that the approach compares favorably with an existing test suite reduction approach.
Starting Page	738
Ending Page	748
File Size	1032035
Page Count	11
File Format	PDF
ISBN	9781467310666
ISSN	02705257
e-ISBN	9781467310673
e-ISBN	9781467310659
DOI	10.1109/ICSE.2012.6227144
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-02
Publisher Place	Switzerland
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault detection Testing Computational modeling Integer linear programming Educational institutions Software on-demand software testing test suite reduction
Content Type	Text
Resource Type	Article
Subject	Software

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

MINTS: A general framework and tool for supporting test-suite minimization

Call stack coverage for test suite reduction

Bi-criteria models for all-uses test suite reduction

An empirical study of the effects of test-suite reduction on fault localization

Improving Fault Detection Capability by Selectively Retaining Test Cases during Test Suite Reduction

Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction

Test suite reduction analysis with enhanced tie-breaking techniques

Bi-objective model for test-suite reduction based on modified condition/decision coverage

Call Stack Coverage for GUI Test-Suite Reduction

On-demand test suite reduction

Similar Documents

MINTS: A general framework and tool for supporting test-suite minimization

Call stack coverage for test suite reduction

Bi-criteria models for all-uses test suite reduction

An empirical study of the effects of test-suite reduction on fault localization

Improving Fault Detection Capability by Selectively Retaining Test Cases during Test Suite Reduction

Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction

Test suite reduction analysis with enhanced tie-breaking techniques

Bi-objective model for test-suite reduction based on modified condition/decision coverage

Call Stack Coverage for GUI Test-Suite Reduction

On-demand test suite reduction