NDLI: Call stack coverage for test suite reduction

Content Provider	IEEE Xplore Digital Library
Author	McMaster, S. Memon, A.M.
Copyright Year	2005
Description	Author affiliation: Dept. of Comput. Sci., Maryland Univ., College Park, MD, USA (McMaster, S.; Memon, A.M.)
Abstract	Test suite reduction is an important test maintenance activity that attempts to reduce the size of a test suite with respect to some criteria. Emerging trends in software development such as component reuse, multi-language implementations, and stringent performance requirements present new challenges for existing reduction techniques that may limit their applicability. A test suite reduction technique that is not affected by these challenges is presented; it is based on dynamically generated language-independent information that can be collected with little run-time overhead. Specifically, test cases from the suite being reduced are executed on the application under test and the call stacks produced during execution are recorded. These call stacks are then used as a coverage requirement in a test suite reduction algorithm. Results of experiments on test suites for the space antenna-steering application show significant reduction in test suite size at the cost of a moderate loss in fault detection effectiveness.
Sponsorship	Univ. of Szeged
Starting Page	539
Ending Page	548
File Size	206537
Page Count	10
File Format	PDF
ISBN	0769523684
ISSN	10636773
DOI	10.1109/ICSM.2005.29
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-09-26
Publisher Place	Hungary
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Instruments Software testing Programming Runtime Fault detection Quality of service System testing Computer science Educational institutions Costs
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Call Stack Coverage for GUI Test-Suite Reduction

Bi-objective model for test-suite reduction based on modified condition/decision coverage

Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction

Call stack coverage for test suite reduction (2005)

On-demand test suite reduction

Call Stack Coverage for GUI Test-Suite Reduction (2006)

A genetic algorithm for test-suite reduction

Call-Stack Coverage for GUI Test Suite Reduction

Study of ERP Test-Suite Reduction Based on Modified Condition/Decision Coverage

Call stack coverage for test suite reduction

Similar Documents

Call Stack Coverage for GUI Test-Suite Reduction

Bi-objective model for test-suite reduction based on modified condition/decision coverage

Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction

Call stack coverage for test suite reduction (2005)

On-demand test suite reduction

Call Stack Coverage for GUI Test-Suite Reduction (2006)

A genetic algorithm for test-suite reduction

Call-Stack Coverage for GUI Test Suite Reduction

Study of ERP Test-Suite Reduction Based on Modified Condition/Decision Coverage

Call stack coverage for test suite reduction