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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ghosh, R.N. Tobias, P. Ejakov, S.G. Golding, B. |
| Copyright Year | 2002 |
| Description | Author affiliation: Center for Sensor Mater. Phys. & Astron. Building, Michigan State Univ., East Lansing, MI, USA (Ghosh, R.N.; Tobias, P.; Ejakov, S.G.; Golding, B.) |
| Abstract | Silicon carbide based metal-oxide-semiconductor (MOS) devices are attractive for gas sensing in harsh, high temperature environments. The response of catalytic gate SiC sensors to hydrogen-containing species has been assumed to be due to the formation of a dipole layer at the metal/oxide interface which gives rise to a voltage translation of the high frequency capacitance voltage (C-V) curve. We have discovered that high temperature (800 K) exposure to hydrogen results in (i) a flat band voltage occurring at a more negative bias than in oxygen and (ii) the transition from accumulation (high capacitance) to inversion (low capacitance) occurring over a relatively narrow voltage range. In oxygen, this transition is broadened indicating the creation of a large number of interface states. We interpret these results as arising from two independent phenomena - a chemically induced shift in the metal/semiconductor work function difference and the passivation/creation of charged states at the SiO/sub 2//SiC interface. MIS capacitance sensors typically operate in constant capacitance mode. These results. affect sensor sensitivity since the slope of the C-V curve changes dramatically with gas exposure. |
| Sponsorship | IEEE Sensor Council |
| Starting Page | 1120 |
| Ending Page | 1125 |
| File Size | 597641 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780374541 |
| DOI | 10.1109/ICSENS.2002.1037271 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-06-12 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Interface states Temperature sensors Silicon carbide Capacitance Voltage Capacitance-voltage characteristics Capacitive sensors Chemical sensors Sensor phenomena and characterization Frequency |
| Content Type | Text |
| Resource Type | Article |
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