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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yamada, Y. Ishii, J. |
| Copyright Year | 2014 |
| Description | Author affiliation: Nat. Metrol. Inst. of Japan, Tsukuba, Japan (Yamada, Y.; Ishii, J.) |
| Abstract | Two dimensional thermal imagers are becoming widely applied to monitoring heat dissipation in designing and fabricating electronic devices. However, the true local surface temperature is usually not obtained without rigorous calibration, due to difficulties such as unknown emissivity, poor imaging quality of the optics, and background radiation. In this presentation, a method to overcome these issues are presented, which makes use of the emissivity distribution pattern detected by the thermal imager by superimposing a modulated background radiation. In particular, in this article, the size-of-source effect caused by the poor imaging quality of the imager is shown to be overcome by the proposed method. |
| Starting Page | 85 |
| Ending Page | 89 |
| File Size | 373277 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781479943746 |
| DOI | 10.1109/SEMI-THERM.2014.6892220 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-03-09 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Temperature measurement Reflectivity Heating Temperature Temperature sensors Imaging Containers thermal measurement Thermal imagers, radiation thermometry, emissivity free, size of-source effect background radiation electronic device |
| Content Type | Text |
| Resource Type | Article |
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