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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Carchon, G. Jenei, S. Carbonell, L. Van Hove, M. Decoutere, S. De Raedt, W. Maex, K. Beyne, E. |
| Copyright Year | 2003 |
| Description | Author affiliation: IMEC, Heverlee, Belgium (Carchon, G.; Jenei, S.; Carbonell, L.; Van Hove, M.; Decoutere, S.; De Raedt, W.; Maex, K.; Beyne, E.) |
| Abstract | Wafer level packaging (WLP) techniques have been used to integrate state of the art high Q on-chip inductors on top of a five-levels-of-metal (5LM) Cu damascene back-end of line (BEOL) silicon process using 20 /spl Omega/.cm Si wafers. The inductors are realized above passivation using thick post-processed low-K dielectric (BCB) and Cu layers. For a BCB/Cu-thickness of 16 /spl mu/m/10 /spl mu/m, a peak Q-factor of 34 at 4.3 GHz has been obtained for a 1 nH inductor (substrate contacts present at both ports) with a resonance frequency of 29 GHz; the Q-factor further tops 30 over the 2.1-5.4 GHz frequency range. If a substrate contact is present at only 1 port, Q/sub max/ increases to 38 at 4.7 GHz. Patterned polysilicon ground shields further improve this performance: a Q-factor increase of 90% is demonstrated at 7 GHz for a 2.25 nH inductor. A good agreement between measurements and 3-D simulations is demonstrated. |
| Starting Page | 1287 |
| Ending Page | 1290 |
| File Size | 311665 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780376951 |
| ISSN | 0149645X |
| DOI | 10.1109/MWSYM.2003.1212605 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-08 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Radio frequency Silicon Wafer scale integration Passivation Q factor Dielectric substrates Thin film inductors Metallization Spirals Dielectric losses |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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