NDLI: Low Power embedded DRAM caches using BCH code partitioning

Content Provider	IEEE Xplore Digital Library
Author	Reviriego, P. Sanchez-Macian, A. Maestro, J.A.
Copyright Year	2012
Description	Author affiliation: Universidad Antonio de Nebrija, C/Pirineos, 55, E-28040, Madrid, Spain (Reviriego, P.; Sanchez-Macian, A.; Maestro, J.A.)
Abstract	Technology advances have recently enabled the use of DRAMs into logic integrated circuits. These embedded DRAMs can be used to efficiently implement caches since DRAMs require substantially less area than SRAMs. One challenge for DRAM based caches is that a small time between refreshes is needed to ensure data retention. These refreshes increase the power consumption even when the cache is idle. To mitigate this issue, the use of longer times between refreshes combined with the use of Error Correction Codes (ECCs) has been recently proposed. The idea is that the time between refreshes can be increased significantly while only causing data retention failures on a small percentage of the cells. Then those errors can be corrected by the ECC. For this scheme to be efficient the number of additional bits required by the ECC should be small. This is achieved by using large data blocks for the ECC which in turns means that a large data block has to be accessed even when only a small portion of it is needed. This has no effect on idle power consumption but increases the dynamic power consumption and reduces the effective memory bandwidth. In this paper, a technique to mitigate this issue is proposed. It enables better granularity in the read data accesses by partitioning the ECC block into two sub-blocks and modifying the error detection and correction processes. This reduces the dynamic power consumption and increases the available memory bandwidth while requiring only a moderate increase in the number of additional bits.
Starting Page	79
Ending Page	83
File Size	196093
Page Count	5
File Format	PDF
ISBN	9781467320825
e-ISBN	9781467320856
DOI	10.1109/IOLTS.2012.6313845
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-27
Publisher Place	Spain
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Error correction codes Power demand Decoding Random access memory Memory management Bandwidth Error correction Low power ECC BCH codes Caches eDRAM memory
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in