NDLI: Influence of depth of interaction on spatial resolution and image quality for the HRRT

Content Provider	IEEE Xplore Digital Library
Author	Blinder, S. Camborde, M.-L. Buckley, K.R. Rahmim, A. Cheng, K.J.C. Ruth, T.J. Sossi, V.
Copyright Year	2005
Description	Author affiliation: British Columbia Univ., Vancouver, BC, Canada (Blinder, S.; Camborde, M.-L.)
Abstract	The high resolution research tomograph (HRRT) is an octagonal design PET camera with 119,808 crystals arranged in a dual layer to determine the depth of interaction (DOI) and compensate for the parallax effect. The DOI discrimination is based on the identification of the layer in which the gamma interaction occurred using pulse shape discrimination. However the observed fractional crystal efficiency is count rate dependent, thus affecting the accuracy of the pulse shape discrimination. In this study we investigated the impact of the mismatch between the emission and the normalization scan count rate on image uniformity using phantom data when DOI correction was applied and when it was switched off. Count rate mismatch was found to manifest itself in form of streaking artifacts and high frequency non-uniformities with a star shape pattern in Fourier space. It was found to be enhanced when DOI correction was applied. In realistic scanning conditions assessed with non-human primate data the effect of count rate mismatch was found to be nearly negligible with DOI correction present or absent. Since DOI corrected data proved to be more sensitive to an emission/normalization count rate mismatch, the impact of DOI on resolution and biological measure obtained in realistic scanning conditions was further evaluated. With DOI determination, spatial resolution was improved by up to 7% in the outer part of the FoV where it was measured to be 2.9 /spl plusmn/ 0.2 mm (SPAN 3) and 3.3 /spl plusmn/ 0.2 mm (SPAN 9) and the biological parameters (binding potentials) extracted from the non-human primate study were improved by up to 5%. In summary this study shows a greater sensitivity to emission/normalization count rate mismatch in phantom studies when DOI correction is present. However much less sensitivity is observed in realistic data, while the resolution uniformity advantage due to DOI determination is still noticeable, not only in resolution measurement but also in the accuracy of the biological measures extracted from realistic scanning protocols.
Starting Page	5
Ending Page	1769
File Size	1083238
Page Count	1765
File Format	PDF
ISBN	0780392213
ISSN	10957863
DOI	10.1109/NSSMIC.2005.1596662
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-23
Publisher Place	Puerto Rico
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Spatial resolution Image quality Shape Pulse shaping methods Imaging phantoms Data mining Positron emission tomography Cameras Crystals Frequency
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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