NDLI: Molecular dynamics simulation of fast ion impact on cluster atoms

Content Provider	IEEE Xplore Digital Library
Author	Sato, F. Kagawa, T. Sakabe, S. Imasaki, K. Iida, T.
Copyright Year	2002
Description	Author affiliation: Dept. of Electron., Inf. Syst. & Energy Eng., Osaka Univ., Japan (Sato, F.; Kagawa, T.; Sakabe, S.)
Abstract	Fragmentation and ion scattering in a fast ion impact on cluster atoms were researched with molecular dynamics simulation methods. The atom evaporation was caused after the incident particle was impacted into the cluster. It has been found from simulation results that the fragmentation distributions have not a large dependence on the energy of the incident particle in the range of 1/spl sim/1000 keV and also the yield of fragments is approximately proportional to m/sup -2.6/ in mass size m. An ion beam experiment was also performed to investigate the fragmentation caused by interaction between a fast ion and cluster atoms. A large cluster for Ar, Xe, H/sub 2/ was detected by the Rayleigh scattering. The responses for a fast ion impact on the large cluster atoms were measured with the experiment system. The interaction rate was estimated to be /spl sim/0.1 event per one pulsed operation of the cluster source and was approximately consistent with experimental results.
Starting Page	250
Ending Page	253
File Size	250233
Page Count	4
File Format	PDF
ISBN	0780373243
ISSN	10823654
DOI	10.1109/NSSMIC.2001.1008452
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-11-04
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Atomic beams Plasma measurements Atomic measurements Laser theory X-ray lasers Rayleigh scattering Ion beams Laser beams Plasma materials processing X-ray scattering
Content Type	Text
Resource Type	Article

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