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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wunderer, C.B. Connell, P. Diehl, R. Georgii, R. van Kienlin, A. Sanchez, F. Schonfelder, V. Strong, A. Vedrenne, G. |
| Copyright Year | 2000 |
| Description | Author affiliation: Max-Planck-Inst. fur Extraterrestrische Phys., Garching bei Munchen, Germany (Wunderer, C.B.) |
| Abstract | ESA's INTErnational Gamma-Ray Astrophysics Laboratory (INTEGRAL) will be launched in 2002. One of its two main instruments is the spectrometer SPI. It uses 19 HPGe detectors to observe the sky in the energy range of 20 keV to 8 MeV with a resolution of /spl Delta/E/E=0.2%. Directional information is obtained using a coded mask. The expected angular resolution is about 2/spl deg/. The SPI Imaging Test Setup (SPITS) was built at MPE to allow experimental verification of the imaging properties of SPI. SPITS consists of a coded HURAmask and two germanium detectors. The mask is built from 63 opaque tungsten-alloy elements. The two hexagonal Ge-detectors are housed in a common aluminum end cap. They are mounted on an XY-table and can be moved to cover the 19 SPI Ge-detector positions. Mask and germanium detectors are made of SPI materials, with the exception of some Be parts which have been replaced by thinner Al parts. The imaging properties of SPITS are being measured with several radioactive sources-at a distance of 9 m from the detector plane. The authors obtain an angular resolution of about 2/spl deg/ at 1.8 MeV and a point-source location capability of SPITS of 15 arcmin at 1.17 MeV. Two-sources whose signal/background ratio is 2.7 are reconstructed correctly at 40 significance level. |
| File Size | 589744 |
| File Format | |
| ISBN | 0780365038 |
| ISSN | 10823654 |
| DOI | 10.1109/NSSMIC.2000.949060 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-10-15 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Optical imaging Testing Spectroscopy Detectors Energy resolution Germanium Astrophysics Laboratories Instruments Aluminum |
| Content Type | Text |
| Resource Type | Article |
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