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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Han, S.H. Hong, W.S. Kim, H.K. Kim, J.G. Park, I.J. Kadyk, J. Wenzel, W. Perez-Mendez, V. |
| Copyright Year | 2000 |
| Description | Author affiliation: Div. of Phys., Lawrence Berkeley Lab., CA, USA (Han, S.H.) |
| Abstract | Insensitive regions and spatial resolution of the microdot (MDOT) detectors having 200 /spl mu/m, 100 /spl mu/m, and 50 /spl mu/m pitches were studied using a collimated X-ray as a probe. The insensitive zones measured by the probe scan were compared with those estimated previously from the drift voltage dependence of the count rate variation. The X-ray probe scan was done along an isolated strip of a ganged linear array of MDOT anodes, and this showed the existence of insensitive zones in the 200 /spl mu/m pitch detector. However, we did not observe these in the in the 100 /spl mu/m and 50 /spl mu/m pitch detectors. The spatial resolution, indicated by the standard deviation of the fitted Gaussian distribution of scanning signals across the anode strip, was determined to be 80 /spl mu/m, 55 /spl mu/m, and 51 /spl mu/m for the 200 Gun, 100 /spl mu/m, and 50 /spl mu/m pitch detectors, respectively. Therefore, the 100 /spl mu/m was determined to be the optimum pitch for absence of the insensitive zones, good spatial resolution, and good avalanche gain. |
| Starting Page | 660 |
| Ending Page | 664 |
| File Size | 470959 |
| Page Count | 5 |
| File Format | |
| ISBN | 0780356969 |
| ISSN | 10823654 |
| DOI | 10.1109/NSSMIC.1999.845755 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-10-24 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Spatial resolution Probes X-ray detection X-ray detectors Anodes Collimators Voltage Sensor arrays Gaussian distribution Strips |
| Content Type | Text |
| Resource Type | Article |
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