NDLI: A study of the timing properties of Cd/sub 0.9/Zn/sub 0.1/Te

Content Provider	IEEE Xplore Digital Library
Author	Parnham, K.B. Eissler, E.E. Jovanovic, S. Lynn, K.G.
Copyright Year	1996
Description	Author affiliation: eV Products, II-VI Inc., USA (Parnham, K.B.; Eissler, E.E.)
Abstract	CdZnTe has become a material of great interest in the field of X- and /spl gamma/-ray imaging, and shows great promise as a highly efficient, room-temperature operation detector. However, data on the timing resolution obtainable with this material is scarce. It is known that CdZnTe, in common with all compound semi-conductors, gives pulses of varying rise-time depending on the interaction location, hence causing a broadening of the time spectrum. We therefore assembled and characterized an appropriate electronic measuring set-up and took data with 2 different sets of detectors, varying the experimental parameters such as bias voltage, threshold and temperature during the course of the experiment. The results obtained with planar detectors of 9 mm/sup 2//spl times/2 mm thick were superior to the results obtained with detectors of 25 mm/sup 2//spl times/10 mm thick, even when the difference in effective bias field strength is considered. Timing resolutions of 5.3 ns and 20.9 ns (FWHM) respectively were obtained. Reducing the temperature to 0/spl deg/C reduced the resolution to 4.5 ns, thereby indicating that the performance is limited by signal-to-noise ratio considerations.
Starting Page	136
Ending Page	138
File Size	276173
Page Count	3
File Format	PDF
ISBN	078033180X
DOI	10.1109/NSSMIC.1995.504194
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-10-21
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Timing Temperature Signal resolution High-resolution imaging Optical imaging Gamma ray detection Gamma ray detectors Assembly Threshold voltage Signal to noise ratio
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

A study of the timing properties of Cd{sub 0.9}Zn{sub 0.1}Te

Study of detection efficiency of Cd/sub 1-x/Zn/sub x/Te detectors for digital radiography

Large Area ${rm Cd}_{0.9}{rm Zn}_{0.1}{rm Te}$ Pixelated Detector: Fabrication and Characterization

Optical properties of Cd{sub 0.9}Zn{sub 0.1}Te studied by variable angle spectroscopic ellipsometry between 0.75 and 6.24 eV

The use of pulse processing techniques to improve the performance of Cd/sub 1-x/Zn/sub x/Te gamma-ray spectrometers

Cd$_{0.9}$ Zn$_{0.1}$ Te Crystal Growth and Fabrication of Large Volume Single-Polarity Charge Sensing Gamma Detectors

X-ray sensitivity of Cd$_{0.9}$Zn$_{0.1}$Te detectors

Characteristics of a planar-type Cd$_{0.9}$Zn$_{0.1}$Te radiation detector grown by using the low-pressure bridgman method

Design and performance of an EMCCD based detector for combined SPECT/CT imaging

A study of the timing properties of Cd/sub 0.9/Zn/sub 0.1/Te

Similar Documents

A study of the timing properties of Cd{sub 0.9}Zn{sub 0.1}Te

Study of detection efficiency of Cd/sub 1-x/Zn/sub x/Te detectors for digital radiography

Large Area ${rm Cd}_{0.9}{rm Zn}_{0.1}{rm Te}$ Pixelated Detector: Fabrication and Characterization

Optical properties of Cd{sub 0.9}Zn{sub 0.1}Te studied by variable angle spectroscopic ellipsometry between 0.75 and 6.24 eV

The use of pulse processing techniques to improve the performance of Cd/sub 1-x/Zn/sub x/Te gamma-ray spectrometers

Cd$_{0.9}$ Zn$_{0.1}$ Te Crystal Growth and Fabrication of Large Volume Single-Polarity Charge Sensing Gamma Detectors

X-ray sensitivity of Cd$_{0.9}$Zn$_{0.1}$Te detectors

Characteristics of a planar-type Cd$_{0.9}$Zn$_{0.1}$Te radiation detector grown by using the low-pressure bridgman method

Design and performance of an EMCCD based detector for combined SPECT/CT imaging

A study of the timing properties of Cd/sub 0.9/Zn/sub 0.1/Te