NDLI: Simple charge division readouts for imaging scintillator arrays using a multi-channel PMT

Content Provider	IEEE Xplore Digital Library
Author	Siegel, S. Silverman, R.W. Yiping Shao Cherry, S.R.
Copyright Year	1996
Description	Author affiliation: Sch. of Med., California Univ., Los Angeles, CA, USA (Siegel, S.; Silverman, R.W.; Yiping Shao; Cherry, S.R.)
Abstract	Three simple charge division circuits were assembled, and tested, as 2-D readouts for multi-channel photomultiplier tubes (MC-PMT). They were evaluated with an 8/spl times/8 array of individual scintillators (2/spl times/2/spl times/10 mm BGO) coupled to a 64 channel MC-PMT (Philips XP1722) via 25 cm long, 2 mm diameter, double clad, optical fibers (Kuraray). This type of /spl gamma/-ray imaging detector has many potential applications in medical and industrial imaging. Independent channel readout allows for the discrimination of scatter within the array, and higher count rates, but it requires an excessive amount of supporting electronics. This is specially true for multi-array imaging systems with hundreds, or thousands, of channels. In this study, the number of channels being read out was reduced from 64 to 4. This was achieved by the use of simple resistor networks which take advantage of the discretized nature of the scintillator array, the low crosstalk of the MC-PMT and low input impedance current-sensitive preamplifiers. For each circuit, the scintillator identification accuracy was compared. The identification accuracy as a function of deposited energy was also determined by exposure to various /spl gamma/ emitters. It was found that the preamplifier circuit noise contributed the most to the degradation of the detector's spatial response so several low noise op amps were evaluated. It was also determined that keeping the preamplifier input impedance small was necessary for accurate positioning. The timing resolution of the detector was slightly degraded by the readout circuit.
Starting Page	13
Ending Page	17
File Size	565436
Page Count	5
File Format	PDF
ISBN	078033180X
DOI	10.1109/NSSMIC.1995.504167
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-10-21
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical imaging Preamplifiers Circuit testing Optical arrays Crosstalk Impedance Circuit noise Degradation Assembly Photomultipliers
Content Type	Text
Resource Type	Article

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