NDLI: Compton scatter and X-ray crosstalk and the use of very thin inter-crystal septa in high resolution PET detectors

Content Provider	IEEE Xplore Digital Library
Author	Levin, C.S. Tornai, M.P. Cherry, S.R. MacDonald, L.R. Hoffman, E.J.
Copyright Year	1996
Description	Author affiliation: Sch. of Med., California Univ., Los Angeles, CA, USA (Levin, C.S.; Tornai, M.P.; Cherry, S.R.; MacDonald, L.R.; Hoffman, E.J.)
Abstract	To improve spatial resolution, PET systems are being developed with finer detector elements. Unfortunately, using smaller crystal sizes increases inter-crystal Compton scatter and bismuth X-ray and (to a lesser degree) electron escape crosstalk, causing positioning errors that lead to degradation of image contrast. The authors investigated the use of extremely thin (/spl les/300 /spl mu/m) lead strips for passive shielding of this inter-crystal crosstalk. Using annihilation photons and small (2 and 3 mm wide) BGO crystals in coincidence, crosstalk studies were performed with either two small adjacent crystals (1-D) or one crystal inside a volume of BGO (2-D). The fraction of Compton scattered events from one crystal into an adjacent one was reduced, on average, by a factor of 3.2 (2.2) in the 1-D experiment and by a factor of 3.0 (2.1) in 2-D, with a 300 (150) /spl mu/m thick lead strip in between the crystals and a 300-700 keV energy window in both crystals. The authors could not measure a reduction in bismuth X-ray crosstalk with the use of lead septa because of the production of lead X-rays. The width of the coincident point spread function was not significantly different for the 1- and 2-D studies, with or without the different thickness septa in place. These results indicate that intercrystal crosstalk does not affect the positioning resolution. A simple insertion of very thin lead strips may significantly reduce the inter-crystal scattering crosstalk of a high resolution PET system, thereby ultimately improving image contrast, without introducing a dead area.
Starting Page	1036
Ending Page	1040
File Size	546474
Page Count	5
File Format	PDF
ISBN	078033180X
DOI	10.1109/NSSMIC.1995.510442
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-10-21
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray scattering Crosstalk Photonic crystals Electromagnetic scattering Particle scattering Strips X-ray imaging Positron emission tomography Bismuth Spatial resolution
Content Type	Text
Resource Type	Article

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