NDLI: Monte Carlo calculation of X-ray spectra emitted by various anode materials at low voltages

Content Provider	IEEE Xplore Digital Library
Author	Wilderman, S.J. Hames, S.M. Flynn, M.J. Martin, W.R.
Copyright Year	1994
Description	Author affiliation: Dept. of Nucl. Eng., Michigan Univ., Ann Arbor, MI, USA (Wilderman, S.J.; Hames, S.M.; Flynn, M.J.; Martin, W.R.)
Abstract	Calculations of the absolute intensity and energy spectra of X-rays emitted by various targets have been performed for tube potentials in the 20-50 kV range using a single scattering Monte Carlo method. Monte Carlo modeling provides an accurate, practical method for obtaining X-ray spectra from arbitrary target materials for which experimental or semi-empirical results are not available. Our Monte Carlo program, SKEPTIC (Simulated Kilovolt Electron and Photon Transport In Condensed media), utilizes fast sampling schemes and employs extensive variance reduction techniques in order to reduce run time inefficiencies normally associated with single scattering electron transport simulations. Cross section data in the SKEPTIC physics model is taken from the partial wave elastic scattering formulation of Riley (1975) and the doubly differential bremsstrahlung description due to Pratt et al. (1977). Calculated spectra and intensities compare well with available experimental data.
Starting Page	1537
Ending Page	1541
File Size	452886
Page Count	5
File Format	PDF
ISBN	0780325443
DOI	10.1109/NSSMIC.1994.474769
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-10-30
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Monte Carlo methods Anodes Low voltage Electrons Particle scattering X-ray scattering Electromagnetic scattering Image edge detection Sampling methods Physics
Content Type	Text
Resource Type	Article

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