NDLI: High density data storage based on the atomic force microscope

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Seventh Biennial IEEE International Nonvolatile Memory Technology Conference. Proceedings (Cat. No.98EX141)

Seventh Biennial IEEE International Nonvolatile Memory Technology Conference. Proceedings (Cat. No.98EX141)

Research and education opportunities in memory technology at the National Science Foundation

Air Force space system requirements for non-volatile memory-a lab perspective

Tunnel oxide and ETOX/sup TM/ flash scaling limitation

Magnetic recording technology-advances through the year 2000 and beyond

Current issues in rewritable optical disk data storage

Overview of non-volatile memory packaging needs and approaches for space based systems

2k nonvolatile shadow RAM and 256k EEPROM SONOS nonvolatile memory development

A 32k/spl times/8 radiation-hardened CMOS/SONOS EEPROM

A 42.5 mm/sup 2/ 1 Mb nonvolatile ferroelectric memory utilizing advanced architecture for enhanced reliability

Static FRAM: an emerging nonvolatile memory technology

Microcontrollers with ferroelectric embedded memory

A 32-bit RISC microcontroller with 448K bytes of embedded flash memory

Optimizing GMR spin valves: the outlook for improved properties

A practical 256K GMR NV memory for high shock applications

High density pseudo spin valve magnetoresistive RAM

Magneto-resistive IC memory limitations and architecture implications

Micro Drive-a pluggable one-inch disk drive for portable devices

Magnetic tape recording technology and devices

High density data storage based on the atomic force microscope

Nonvolatile optical storage in photorefractive crystals

Advances in 3D two-photon optical storage devices

Recent developments in vertical Bloch line data storage

Spatial and electronic manipulation of silicon nanocrystals by atomic force microscopy

Hybrid ferromagnet-semiconductor gates for nonvolatile memory

Bacteriorhodopsin-based volumetric optical memory

Nonvolatile memory based on mobile protons

High density packaging of flash memory

Micro-ball grid arrays: a practical chip-size packaging solution for nonvolatile memory applications

Low-cost, high density non volatile memory for military and space applications

Reliability of reprogrammable nonvolatile memories

Protecting COTS ICs for space

Rapid development of MCM-based nonvolatile memory subsystems

Investigation of tunneling current through thin dielectrics

Proceedings of Nonvolatile Memory Technology Conference

[1993 Proceedings] Fifth Biennial Nonvolatile Memory Technology Review

High density data storage based on the atomic force microscope

Content Provider	IEEE Xplore Digital Library
Author	Mamin, H.J. Ried, R.P. Terris, B.D. Rugar, D. Chui, B.W. Kenny, T.K.
Copyright Year	1998
Description	Author affiliation: IBM Almaden Res. Center, San Jose, CA, USA (Mamin, H.J.)
Abstract	Summary form only given. The atomic force microscope (AFM) uses a sharp tip on the end of a micromachined cantilever to image surfaces at the nm scale. Such structures can be batch fabricated, with tip radii below 100 /spl Aring/. The simplicity and high resolution of the technique have led to interest in its possible use as the basis for a high density data storage device. We have explored one approach to AFM-based storage based on mechanical readback of topographic data. To this end, we have fabricated low-mass Si cantilevers with integrated piezoresistive sensors. Integrating the sensor on the cantilever allows for very compact implementation. By reducing the cantilever mass, we have reduced the mechanical response time to as low as 90 ns. This corresponds to data rates of at least 10 Mb/s, comparable to that of the DVD. We have developed these cantilevers for both read-only applications and write-once applications. For read-only applications, electron beam lithography was used to create a master disk, which is then replicated using a stamping process into a photopolymer. Densities of 65 Gb/in/sup 2/, or 100/spl times/ that of CDs, were achieved. To write, the tip is heated through an integrated resistive heater. The tip then softens and deforms the polymer material under it, creating a pit. Beyond demonstrating the basic techniques, considerable progress has been made in addressing critical issues such as data rate, reliability, and practical implementation. Significant challenges still remain, both in overcoming technical hurdles, and in finding applications that are well suited to the characteristics of such a device.
File Size	62564
File Format	PDF
ISBN	0780345185
DOI	10.1109/NVMT.1998.723220
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-06-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Atomic force microscopy Memory Atomic measurements Mechanical sensors Surface topography Piezoresistance Delay DVD Electron beams Lithography
Content Type	Text
Resource Type	Article

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