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Content Provider | IEEE Xplore Digital Library |
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Author | Alekseev, E. Pavlidis, D. |
Copyright Year | 1999 |
Description | Author affiliation: Solid State Electron. Lab., Michigan Univ., Ann Arbor, MI, USA (Alekseev, E.) |
Abstract | The switching-rate capability of mm-wave InGaAs PIN diodes of various sizes was evaluated for the first time by measuring their response times under various bias conditions. The dependencies of InGaAs PIN diode switching times are discussed, and the results are correlated with their DC characteristics. InGaAs PIN diodes demonstrated short switching times (fall time /spl tau//sub F/=250 ps and rise time /spl tau//sub R/=130 ps). Switching in large diodes was limited by bulk time constants, while faster switching in small diodes was due to increased surface effects. Switching of InGaAs PIN diodes at a high rate of 5Gbps was observed. |
Starting Page | 443 |
Ending Page | 446 |
File Size | 385123 |
Page Count | 4 |
File Format | |
ISBN | 0780355628 |
ISSN | 10928669 |
DOI | 10.1109/ICIPRM.1999.773728 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1999-05-16 |
Publisher Place | Switzerland |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Indium gallium arsenide Diodes Radar Switches Indium phosphide Delay Signal generators Testing Consumer electronics Time measurement |
Content Type | Text |
Resource Type | Article |
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