NDLI: Phase guided sampling for efficient parallel application simulation

Content Provider	IEEE Xplore Digital Library
Author	Namkung, J. Dohyung Kim Gupta, R. Kozintsev, I. Bouget, J.-Y. Dulong, C.
Copyright Year	2006
Description	Author affiliation: Univ. of California, San Diego (Namkung, J.; Dohyung Kim)
Abstract	Simulating chip-multiprocessor systems (CMP) can take a long time. For single-threaded workloads, earlier work has shown the utility of phase analysis, that is identification of repetitive program behaviors, in reducing overall simulation time while maintaining an acceptable loss in accuracy. To cope with multithreaded workloads, a combination of phases from all executing threads must be taken into consideration since inter-thread interference may distort the homogeneity of each phases' true performance. Unfortunately, phase analysis does not work for multithreaded (MT) workloads because the possible phase combinations in an inherently nondeterministic execution model grows exponentially with the number of threads. To this end, we propose a new technique to reduce the number of simulation samples by synthesizing samples from similar phase combinations. We present a simple cost function for measuring the similarity between phase combinations and by using the individual thread samples from the similar phase combinations, a new sample can be constructed. This cost function provides a convenient control knob for exploiting tradeoffs between simulation speed and accuracy. Our experimental results show that in most cases, properly setting the cost function's threshold can yield a reduction in sampling by 90%, while maintaining error to less than 5%.
Starting Page	187
Ending Page	192
File Size	227970
Page Count	6
File Format	PDF
ISBN	1595933700
DOI	10.1145/1176254.1176301
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-10-22
Publisher Place	South Korea
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Sampling methods Yarn Analytical models Surface-mount technology Cost function Interference Phase measurement Performance analysis Multithreading Permission simulation chip multiprocessors multithreading phase analysis sampling
Content Type	Text
Resource Type	Article

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