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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Supin Chen Chang-Jin Cj Kim |
| Copyright Year | 2014 |
| Description | Author affiliation: Mech. & Aerosp. Eng. Dept., Univ. of California, Los Angeles, Los Angeles, CA, USA (Chang-Jin Cj Kim) || Bioeng. Dept., Univ. of California, Los Angeles, Los Angeles, CA, USA (Supin Chen) |
| Abstract | Anodized dielectrics in a mirrored arrangement are proposed and evaluated for the parallel-plate electrowetting-on-dielectric (EWOD) configuration. As valve metal oxides with current rectifying effects, anodized dielectrics previously could only be used for EWOD under a restricted range of voltages. However, in a mirrored configuration, one side of the anodized dielectric pair is expected to always be under the correct bias to restrict current. Both the mirrored and typical configurations were tested with current leakage measurements on anodized alumina samples under cycles of negative and positive bias and a range of electric fields. The mirrored configuration was effective in limiting current leakage over all voltages applied. |
| Sponsorship | IEEE Robot. Autom. Soc. |
| Starting Page | 1011 |
| Ending Page | 1014 |
| File Size | 1204615 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781479935093 |
| DOI | 10.1109/MEMSYS.2014.6765815 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-01-26 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Dielectrics Metals Current measurement Electrodes Valves Leakage currents Electric fields |
| Content Type | Text |
| Resource Type | Article |
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