NDLI: Complete AM and residual PM noise measurements of an external cavity semiconductor laser hybridly modelocked at 10 GHz

Content Provider	IEEE Xplore Digital Library
Author	Yilmaz, T. DePriest, C.M. Delfyett Jr., P.J. Abeles, J.H. Braun, A.
Copyright Year	2001
Description	Author affiliation: Sch. of Opt., CREOL, Orlando, FL, USA (Yilmaz, T.)
Abstract	Modelocked semiconductor and fiber lasers have been shown to operate with very low noise levels making them suitable as sources of sampling pulses for applications in analog-to-digital converter (ADC) technologies. In spite of the need for long cavities in fiber lasers, obtaining multigigahertz sampling rates has been possible by harmonic modelocking at high integer multiples of the relatively low fundamental cavity frequencies. Semiconductor lasers, on the other hand, have the capability of operating in both regimes (cavities can be either long or short). For harmonically modelocked lasers, noise spurs will arise at harmonics of the cavity frequency, while fundamental modelocking has the ability to eliminate these spurs. At multigigahertz sampling rates, every doubling in the sampling frequency causes the ADC resolution to fall by /spl sim/1 bit due to phase modulation (PM) noise (timing jitter) in the sampler. Accurate evaluation of pulse train noise then becomes an important issue. Commonly, reported measurements of PM noise extend out to limited offset frequencies (several tens of megahertz or lower). To consider the noise characterization complete, however, sideband measurements should extend to the highest offset frequencies possible (i.e. the Nyquist frequency). For harmonically modelocked lasers, this offset range will include noise spurs arising from harmonic beating mechanisms. We report measurements of AM and residual PM noise out to the Nyquist offset frequency (5 GHz) of a hybridly modelocked external cavity semiconductor laser for fundamental cavity frequency modelocking as well as harmonic modelocking.
Starting Page	906
Ending Page	907
File Size	166103
Page Count	2
File Format	PDF
ISBN	0780371054
ISSN	10928081
DOI	10.1109/LEOS.2001.969111
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-11-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Noise measurement Semiconductor device noise Laser modes Laser noise Semiconductor lasers Fiber lasers Sampling methods Frequency measurement Noise level Optical pulses
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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