NDLI: Measurement of spontaneous emission spectra of diode laser structures

Content Provider	IEEE Xplore Digital Library
Author	Lewis, G.M. Smowton, P.M. Thomson, J.D. Summers, H.D. Blood, P.
Copyright Year	2001
Description	Author affiliation: Dept. of Phys. & Astron., Cardiff Univ., UK (Lewis, G.M.)
Abstract	The unamplified spontaneous emission spectrum emitted under high injection conditions provides a valuable insight into the behaviour of semiconductor laser structures. To determine this spectrum directly, amplification or absorption of the emission must be avoided, for example by observation through a top-contact window. While it is possible, under favourable circumstances, to transform the emission spectrum to a gain spectrum, it is preferable to measure optical gain by more direct methods, usually by analysis of the amplified spontaneous emission from the end of the device, for example by a single-pass stripe length method. A complete characterisation of the semiconductor gain medium therefore requires a combination of techniques for measurement of spontaneous emission and of optical gain as has been done by fabricating a segmented-contact structure for a single-pass gain measurement with a window in the top contact for observation of spontaneous emission. However this is a complex device and it is necessary to observe emission from the device in two different directions. Furthermore the gain and emission spectra are obtained from different regions of the sample. In this paper we show that the gain and true spontaneous emission spectrum can be obtained from amplified spontaneous emission spectra alone. We confirm the validity of the process by comparison with the true spontaneous emission spectrum observed through a top-contact window and show how the emission spectrum may be expressed in real units. This approach provides considerable simplification of the technique and enables both the TE and TM emission spectra to be measured, which is not possible with window methods.
Starting Page	655
Ending Page	656
File Size	146225
Page Count	2
File Format	PDF
ISBN	0780371054
ISSN	10928081
DOI	10.1109/LEOS.2001.968984
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-11-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Spontaneous emission Diode lasers Gain measurement Length measurement Extraterrestrial measurements Shape measurement Equations Stimulated emission Optical devices Optical pumping
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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