NDLI: Multiresolution despeckling of VHR SAR images based on MRF segmentation

Content Provider	IEEE Xplore Digital Library
Author	Alparone, L. Argenti, F. Bianchi, T. Abbate, M. D'Elia, C. Mariano, P. Meta, A.
Copyright Year	2010
Description	Author affiliation: Dept. Electronics & Telecommunications, University of Florence, Via S. Marta, 3, 50139, Italy (Alparone, L.; Argenti, F.; Bianchi, T.) \|\| MetaSensing, Huygensstraat, 44, 2201 DK Noordwijk, The Netherlands (Meta, A.) \|\| University of Cassino, Department DAEIMI, Via Di Biasio, 43, 03043, Italy (Abbate, M.; D'Elia, C.; Mariano, P.)
Abstract	In this work, maximum a posteriori (MAP) despeckling, implemented in the multiresolution domain defined by the undecimated discrete wavelet transform (UDWT), will carried out on very high resolution (VHR) SAR images and compared with earlier multiresolution approaches developed by the authors. The MAP solution in UDWT domain has been specialized to SAR imagery. Every UDWT subband is segmented into statistically homogeneous segments and one generalized Gaussian (GG) PDF (variance and shape factor) is estimated for each segment. This solution allows to effectively handle scene heterogeneity as imaged by the VHR SAR system. Segmentation exploits a Tree Structured Markov Random Field (TSMRF), which is a low complexity MRF segmentation that allows the estimation of the number of segments and the segmentation itself to be carried out at same time. Experiments performed on a single-look VHR X-band SAR images demonstrate that the segmented approach is effective whenever the classical circular Gaussian model of complex reflectivity may no longer hold.
Starting Page	288
Ending Page	291
File Size	311464
Page Count	4
File Format	PDF
ISBN	9781424495658
ISSN	21537003
e-ISBN	9781424495665
e-ISBN	9781424495641
DOI	10.1109/IGARSS.2010.5652111
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-07-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Image segmentation Estimation Image resolution Wavelet transforms Wavelet domain Mathematical model Speckle
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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