NDLI: Characterization of full surface roughness in agricultural soils using groundbased LiDAR

Content Provider	IEEE Xplore Digital Library
Author	Fernandez Diaz, J.C. Judge, J. Slatton, K.C. Shrestha, R. Carter, W.E. Bloomquist, D.
Copyright Year	2010
Description	Author affiliation: University of Florida, Dept. of Civil & Coastal Engineering, USA (Fernandez Diaz, J.C.; Shrestha, R.; Carter, W.E.; Bloomquist, D.) \|\| University of Florida, Dept. Agricultural & Biological Engineering, USA (Judge, J.) \|\| University of Florida, Dept. of Electrical & Computer Engineering, USA (Slatton, K.C.)
Abstract	Microwave emission and scattering models require the parametrization of surface roughness. Traditionally this has been achieved by sampling the surface in transects. In this work, roughness is characterized from 3D surface models derived from ground-based LiDAR. The dataset consist 18 surfaces with varying roughness characteristics. 2D profiles extracted from the surface model constitute the baseline to compare to traditional profiling methods. It was found that sampling using profiles produces an underestimation of the RMSh by 25–63% and an even more severe underestimation in the correlation length that can reach up to an order of magnitude difference. From the 17,178 2D extracted profiles it was determined a significant sensitivity of the roughness parameters to the detrending methods, as well as a poor fit between the experimental ACF and the exponential and Gaussian models. Finally, methodologies to detrend quasi-periodic surfaces and the decomposition of surface at different scales are proposed and illustrate the advantage of having a 3D representation.
Starting Page	4442
Ending Page	4445
File Size	589272
Page Count	4
File Format	PDF
ISBN	9781424495658
ISSN	21537003
e-ISBN	9781424495665
e-ISBN	9781424495641
DOI	10.1109/IGARSS.2010.5652056
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-07-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Surface roughness Rough surfaces Correlation Soil Surface waves Laser radar Surface treatment Terrain mapping Remote sensing Soil moisture Soil roughness
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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