NDLI: A frame-level measurement apparatus for performance testing of ATM equipment

Content Provider	IEEE Xplore Digital Library
Author	Angrisani, L. Baccigalupi, A. D'Angiolo, G.
Copyright Year	2001
Description	Author affiliation: Dipartimento di Inf. e Sistemistica, Naples Univ., Italy (Angrisani, L.)
Abstract	Performance testing of ATM equipment is here dealt with. In particular, the attention is paid to frame-level metrics, recently proposed by the ATM forum because of their suitability to reflect user-perceived performance better than traditional cell-level metrics. Following the suggestions of the ATM forum, more and more network engineers and production managers are nowadays interested in these metrics, thus increasing the need of instruments and measurement solutions appropriate to their estimation. Trying to satisfy this exigency, a new VXI-based measurement apparatus is proposed in the paper. The apparatus features a suitable software, developed by the authors, which allows the evaluation of the aforementioned metrics by making simply use of common ATM analyzers; only two VXI line interfaces, capable of managing both the physical and ATM layer, are, in fact, adopted. At first, some details about the hierarchical structure of the ATM technology as used as the main differences between frames, peculiar to the ATM adaptation layer, and cells characterizing the lower ATM layer are given. Then, both the hardware and software solutions of the measurement apparatus are described in detail with a particular attention to the measurement procedures implemented. At the end the performance of a new ATM device, developed by Ericsson, is assessed in terms of frame-level metrics by means of the proposed apparatus.
Sponsorship	IEEE Instrum. & Meas. Soc.
Starting Page	1630
Ending Page	1635
File Size	585354
Page Count	6
File Format	PDF
ISBN	0780366468
ISSN	10915281
DOI	10.1109/IMTC.2001.929479
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-05-21
Publisher Place	Hungary
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Asynchronous transfer mode 3G mobile communication Telecommunication switching Communication switching Quality of service B-ISDN Particle measurements Software measurement GSM
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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