NDLI: Uncertainty analysis in two-terminal impedance measurements with residual correction

Content Provider	IEEE Xplore Digital Library
Author	Torrents, J.M. Pallas-Areny, R.
Copyright Year	2001
Description	Author affiliation: Dept. de Eng. Electron., Univ. Politecnica de Catalunya, Barcelona, Spain (Torrents, J.M.)
Abstract	Residual impedance correction in impedance analyzers when using an asymmetrical test fixture needs three reference measurements, usually open circuit, short circuit, and load (meaning an impedance close to the impedance under test). This paper provides an uncertainty estimate for impedance measurements that apply a simple open/short correction in spite of using an asymmetrical test fixture. Experimental results show that the minimal uncertainty is obtained for impedance values close to the geometric mean of the short-circuit and open-circuit impedances, and that the theoretical prediction is indeed an upper limit for the actual uncertainty.
Sponsorship	IEEE Instrum. & Meas. Soc.
Starting Page	1450
Ending Page	1453
File Size	315046
Page Count	4
File Format	PDF
ISBN	0780366468
ISSN	10915281
DOI	10.1109/IMTC.2001.929446
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-05-21
Publisher Place	Hungary
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Impedance measurement Circuit testing Fixtures Joining processes Gain measurement Predictive models Electric variables measurement Cables Measurement uncertainty Yield estimation
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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