NDLI: Pharmaceutical tablet hardness measurements with thz pulsed imaging

Content Provider	IEEE Xplore Digital Library
Author	May, R.K. Lianghao Han Alton, J. Shuncong Zhong Elliott, J.A. Byers, C. Gladden, L.F. Evans, M. Yaochun Shen Zeitler, J.A.
Copyright Year	2009
Description	Author affiliation: Department of Chemical Engineering and Biotechnology, University of Cambridge, Cambridge CB2 3RA, UK (May, R.K.; Gladden, L.F.; Zeitler, J.A.) \|\| Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool L69 3GJ, UK (Shuncong Zhong; Yaochun Shen) \|\| Oystar Manesty, Merseyside L34 9JS, UK (Byers, C.) \|\| TeraView, Ltd., St. John's Innovation Park, Cambridge CB4 0WS, UK (Alton, J.; Evans, M.) \|\| Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB2 3QZ, UK (Lianghao Han; Elliott, J.A.)
Abstract	We present the results of terahertz pulsed imaging (TPI) experiments to measure the ‘hardness’ of pharmaceutical solid dosage forms (tablets) compacted at various compression forces. Results of TPI measurements are compared to those from diametric compression tests as well as finite element analysis (FEA) simulations of density distributions on the surface of the tablet. In both cases strong correlation with TPI results was found. In particular, radially symmetric spatial distributions in tablet density due to the shape of the punch used in tablet manufacture were observed. The results of these experiments show that TPI is suitable for non-destructive monitoring and control of pharmaceutical manufacturing processes.
Starting Page	1
Ending Page	2
File Size	550725
Page Count	2
File Format	PDF
ISBN	9781424454167
DOI	10.1109/ICIMW.2009.5325603
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-09-21
Publisher Place	South Korea
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Pulse measurements Pharmaceuticals Optical imaging Pulse compression methods Submillimeter wave measurements Force measurement Solids Density measurement Testing Finite element methods
Content Type	Text
Resource Type	Article

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