NDLI: THz near-field measurement of a square hole

Content Provider	IEEE Xplore Digital Library
Author	Adam, A.J.L. Brok, J. Nagel, M. Seo, M.A. Kim, D.S. Planken, P.C.M.
Copyright Year	2007
Description	Author affiliation: Tech. Univ. of Delft, Delft (Adam, A.J.L.; Brok, J.)
Abstract	We report on a technique to perform broadband near-field optical microscopy (ANSOM) in the THz domain, in which all components of the THz near-field are measured directly using electro-optic detection in GaP electro-optic crystals with a focused near-IR probe beam. The spatial resolution of our technique is much smaller than the THz wavelengths. This enables us to measure with great accuracy the time-dependent distortion of the field around objects, such as slits, holes or spheres, placed in the THz beam. This technique also provides temporal resolution far below the THz oscillation period. As an example, we present measurements of all components of the electric field in a plane underneath a 200 mum by 200 mum square hole made by gold deposition on a silicon sample, and by deposition directly onto the GaP detection crystal. On the shadow side of the gold layer, we observe a strong evanescent field for the z-component at the edges of the hole, even for wavelengths more than 20 times longer than the hole dimensions. Our spatial resolution can be two-orders of magnitude below the wavelength limit. Using our ability to measure all components of the time- dependent electric field, we are able to present a 2D vector plot of the electric field near the hole, in a plane below the metal film.
Starting Page	917
Ending Page	918
File Size	244181
Page Count	2
File Format	PDF
ISBN	9781424414383
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-09-02
Publisher Place	UK
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronic Engineers, Inc.
Subject Keyword	Wavelength measurement Distortion measurement Spatial resolution Optical microscopy Electric variables measurement Gold Performance evaluation Optical devices Optical distortion Optical films plasmon TeraHertz near field subwavelength
Content Type	Text
Resource Type	Article

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