NDLI: Manufacturing Optimization for Improved Reliability in TCXO Oscillator Designs

Content Provider	IEEE Xplore Digital Library
Author	Logue, M. Cremins, R.
Copyright Year	2006
Description	Author affiliation: Production Eng., MtronPTI, Yankton, SD (Logue, M.)
Abstract	The reliability of temperature controlled crystal oscillator designs can be improved through process optimization and controlling key process variables. Industry demands for a highly reliable TCXO combines the need for the frequency accuracy of complex oscillator designs with long-term reliability. A project intended to improve the long-term reliability focused on key process steps of oscillator thick film substrate assembly including design layout, solder application, solder reflow, and component circuit tuning. The project starting point was an oscillator design statistically capable of meeting the customer's requirements. Design layouts were evaluated to minimize unbalanced or abnormal component stresses. The solder application and solder reflow process points were closely evaluated through a design of experiments to provide the most robust construction. Component circuit tuning is a common practice in TCXO and OCXO products. Because of the manual nature of component selecting it is difficult to maintain quality control. Focused reliability testing, along with accelerated life testing verified or identified product and process improvements. Optimization was measured through a quantifiable increase of performance during qualification tests, accelerated life test, test to failure, and ultimately field performance. Selecting the correct test method to measure meaningful reliability improvement was a key element in the project. Test to failure and accelerated life tests identified reliability optimization opportunities on parts that successfully passed all required qualification tests
Starting Page	343
Ending Page	350
File Size	417906
Page Count	8
File Format	PDF
ISBN	1424400740
DOI	10.1109/FREQ.2006.275410
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-06-04
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Design optimization Oscillators Life testing Life estimation Temperature control Circuit optimization Qualifications Process control Manufacturing industries Frequency
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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