NDLI: An FPGA chip identification generator using configurable ring oscillator

Content Provider	IEEE Xplore Digital Library
Author	Haile Yu Leong, P.H.W. Qiang Xu
Copyright Year	2010
Description	Author affiliation: School of Electrical and Information Engineering, University of Sydney, Australia (Leong, P.H.W.) \|\| Department of Computer Science and Engineering, The Chinese University of Hong Kong, China (Haile Yu; Qiang Xu)
Abstract	An improved chip identification (ID) generator, otherwise known as a physically unclonable function (PUF) is described. Similar to previous designs, a cell, i, is used to obtain a measure of the difference in period of four ring oscillators and obtain the residue Ri, a random variable. Experiments show it is normally distributed with a mean of 0. A binary output value of 0 or 1 assigned depending on the sign of Ri. When \|E(Ri)\| is large, this scheme consistently gives the same output. Unfortunately, when it is small, the repeatability is compromised, particularly when variations in operating conditions such as supply voltage and temperature are also taken into account, which is a common problem for all previous works. To address this problem, we propose a cell with configurable ring oscillators together with an orthogonal re-initialisation scheme. Together, these two techniques maximise repeatability by causing the distribution of the mean of different Ri's to change from normal to bimodal. We implement this design in the Xilinx Spartan-3e FPGA. Nine FPGA chips are tested, and experimental results show that the new method significantly enhances reliability of ID generation and tolerance to environmental changes. Bit flip rate is reduced from 1.5% to approximately 0 at a fixed supply voltage and room temperature. Over the 20 – 80°C temperature range, and a 25% variation in supply voltage, the bit flip rate is reduced from 1.56% to 3.125 } $10^{−7},$ which is a 50000x improvement.
Starting Page	312
Ending Page	315
File Size	143876
Page Count	4
File Format	PDF
ISBN	9781424489800
e-ISBN	9781424489831
DOI	10.1109/FPT.2010.5681438
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-12-08
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Field programmable gate arrays Arrays Generators Table lookup Ring oscillators Temperature sensors
Content Type	Text
Resource Type	Article

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