NDLI: Optimal release time determination for multi upgradation SRGM with faults of different severity using genetic algorithm

Content Provider	IEEE Xplore Digital Library
Author	Tickoo, A. Kapur, P.K. Khatri, S.K. Verma, A.K.
Copyright Year	2015
Description	Author affiliation: Amity Sch. of Eng., Amity Univ., Noida, India (Tickoo, A.) \|\| Amity Inst. of Inf. Technol., Amity Univ., Noida, India (Khatri, S.K.) \|\| Stord Univ. Coll., Stord Univ., Haugesund, Norway (Verma, A.K.) \|\| Amity Center for Interdiscipl. Res., Amity Univ., Noida, India (Kapur, P.K.)
Abstract	As the competition among the software companies is increasing, firms have become more demand driven. Advancements in technology and up gradations have become important force in software markets today. By adding new features company aims to improve the quality of the software in terms of performance and functionality. But these new features cause an increase in the fault content and hence the complexity of the software. Therefore the testing team needs to keep track of these faults along with the faults that have been left from the previous release. In the proposed model we have developed a multi up gradation software reliability model upon classifying the faults into three different types depending on the effort and time consumed for their removal: simple, hard and complex faults. In this paper optimization equation for cost model is described to determine the optimal release time in multi up-gradation of software, here we have also taken into account the undetected faults from the previous release. We have used Genetic algorithm approach for optimization. The validation of the proposed model was done on real life data set for four releases of software.
Starting Page	1
Ending Page	6
File Size	249425
Page Count	6
File Format	PDF
e-ISBN	9781467372312
DOI	10.1109/ICRITO.2015.7359322
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-09-02
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Multi-up gradation Software Reliability Growth Model (SRGM) Computer bugs Non-homogenous Poisson Process (NHPP) Debugging Fault Severity Software Genetic Algorithm (GA) Software reliability Mathematical model Testing Genetic algorithms
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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