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Content Provider | IEEE Xplore Digital Library |
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Author | Hu, D.Q. Wu, Y. Kang, B.W. Jia, Y.P. Sin, J.K.O. |
Copyright Year | 2009 |
Description | Author affiliation: Dept. of Electronics and Computer Engineering, The Hong Kong University of Sci. & Tech., Clear Water Bay, Kowloon, China (Sin, J.K.O.) || Dept. of Electronic Sci. & Tech., Beijing University of Technology, 100, Pingleyuan, Chaoyang District, China (Hu, D.Q.; Wu, Y.; Kang, B.W.; Jia, Y.P.) |
Abstract | A new type of insulated gate bipolar transistor (IGBT)—internal transparent collector (ITC) IGBT is proposed. It is quite similar to that of the PT-IGBT, but a very low carrier lifetime control region is introduced in the P+ substrate near the p-collector/n-buffer junction. Based on quasi-static hypothesis, the ITC-IGBTs' static characteristic equations are given. The turn-off equations are also derived on base of non-quasi-static analysis. The model is used to our fabricated device structure and the results fit well to the experiment results. Based on the relationship of Von and local carrier lifetime, electron lifetime in carrier lifetime control region is deduced. They are at range of 0.2–30 nanoseconds. The static performance as well as turn-off loses of ITC-IGBT is compared to PT- and FS-IGBT. The ITC-IGBT shows good potential for 600V IGBT applications. |
Starting Page | 3948 |
Ending Page | 3953 |
File Size | 554613 |
Page Count | 6 |
File Format | |
ISBN | 9781424428939 |
DOI | 10.1109/ECCE.2009.5316183 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2009-09-20 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Insulated gate bipolar transistors Buffer layers Temperature IGBT Doping Electron mobility Charge carrier processes Threshold voltage Helium Charge carrier lifetime Equations Transparent collector |
Content Type | Text |
Resource Type | Article |
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